DTS-1000 dynamic test systems provide high-speed testing and sorting of discrete semiconductors by connecting with probe stages of sorting machines. Applicable test devices include transistor, MOS-FET, Diode, Zener, TS, CV, dVBE & dVDS, SCR, Terminal Regulator & Shunt Regulator, TVS and more. JUNO test systems offer great scalability, as voltage can be extended to 3000 volts and current can be extended to 200 Amps.

The LV-1000 Inductive Load Tester can be used to test avalanche tolerance for MOS-FETs, diodes or IGBT. Inputting current into the coil, the created energy will be used as avalanche energy, so the equipment can conduct tolerance test. Quality determination is judged by quality range settings of SUS voltage and SUS time. The measurement results can be displayed on computer screens or via classification signals transmitted to Handler-I/F.

DHV-1000 is an optional upgrade to DTS-1000 test system, allowing 3000V when testing leakage current or withstand voltage. This upgrade option can only be used in combination with DTS-1000.

By connecting DHC-1000 High Current Upgrade with DTS-1000 test system, it will enable users to test high current range with semiconductor transistors, FETs and thyristors. It can reach a maximum test current of 200A.

TR-2020 is used to test thermal resistance characteristic of transistor by measuring temperature change of the PN junction. The results will be compared with pre-specified values and classified into VF1 and Δ VF at the same time (displayed on the front panel). TR-2020 is designed to facilitate manual and automated testing, using processors to evaluate applicable devices, such as low to high signal PNP, NPN, N&P-MOSFETs, and IGBT. TR-2020 can also be used to obtain data determining SOA.

The GDU-1000 equipment offers communication with other test systems and is connected to a high-precision tester through a standard RS232 serial port. Using DTS-1000 test software and connected to IEEE488(GPIB) port, allows test instruments to conduct testing and screening of special discrete devices. This can fulfill user's requirements to test special device, such as it's electric capacity measurement as well as inductance and resistance testing.

SWS-1000TS (PCB) is a semiconductor testing equipment for the purpose of testing the switching time of transistors. The switching time can be tested in the range of 00.01us to 99.99us (accuracy 2.5%). In addition, this optional equipment can be directly installed in a DTS-1000 test system and can be tested simultaneously for conventional DC items and TS items. This simplifies subsequent classification and reduces the wear of device pins caused by multi-stationary testing.

SC-2XX0 scanner is an extended option for DTS-1000 test system. It's key functionality is to test multiple chips of different or the same specifications packaged in a multi-PIN discrete device.

The SC-1XX0 multi-pin scanner is an extended option for DTS-1000 test system. Its key functionality allows the testing of discrete device products with multiple chips in one package.

MB-1000 manual test box can support manual triggered test for any test devices. Manual test station can also display classification results.

By adding this accessory, customers can test the electrical performance parameters of semiconductor voltage stabilizers. It can test DC parameters characteristics of TL431 reference voltage integrated circuit, 78 and 79 series stabilized voltage integrated circuit and LM1117, LM317 etc. adjustable voltage stabilizing circuits.

Through addition of this accessory, DTS-1000 test system will be able to test thyristor products. Most common test programs are: IGT1-4 quadrant trigger current, VGT1-4 quadrant trigger voltage, IH1-4 quadrant holding current, VTM, Ilatch and other thyristor programs

The MRB-1000 multifunctional test switching box is an optional accessory, which can connect DC (DTS-1000) and EAS (LV-1000) and capacitor (E4980A)on one test station to run tests. MRB switching box is applicable for DC test, capacitance test, switching between inductive and load tests. It can handle all test requirements in one single test station, which is highly suitable for chip test.

The DVBE function is to test the thermal resistance characteristics of any test device by measuring the temperature amelioration (mV) of the host as the PN plane. The test value will be compared with pre-defined pass value also displaying ΔVF values.