DTS-1000 Dynamic Test System
DTS-1000 dynamic test systems provide high-speed testing and sorting of discrete semiconductors by connecting with probe stages of sorting machines. Applicable test devices include transistor, MOS-FET, Diode, Zener, TS, CV, dVBE & dVDS, SCR, Terminal Regulator & Shunt Regulator, TVS and more. JUNO test systems offer great scalability, as voltage can be extended to 3000 volts and current can be extended to 200 Amps.
DTS-1000 Dynamic Test System Features:
1. Multiple system configurations available
2. Great scalability to 3000 volts and 200 Amps
3. More efficient capacity
4. Simple external interfaces
5. Multifunctional operating software
6. Simple maintenance
7. Future scalability
Key Specifications
| Voltage / Current | 999V / 20.0A |
| Number of channels | Max. 2 Channels |
| Power supply voltage | AC 200-240V; 50Hz/60Hz |
| Consumption Electricity | 250VA |
| Dimensions | DTS-1000:500 (width) X670 (depth) X250 (height) mm |
| interface box: 65 (width) X272 (depth) X187 (height) mm |
Test Specifications
Forcing:
| Number / item of Bias | standard 3 (3 bits) (D/A Converter) |
| Bias loop | Standard Specification |
| High Voltage Generator | (999V/20mA) 1 loop |
| Voltage & Current Generator | 3 loop |
| Voltage Generator | (36V/20A) |
| Current Generator | (36V/20A) |
Detection:
| Number/item of measurements | 1 (4 bits) (A/D converter) |
| Measuring circuit | Standard Specification |
| High Voltage Detector | (0.000V ~ 999.9V)1 circuit |
| Low Voltage Detector | (00.00mV ~ 36.00V) 1 loop |
| Current Generator | (0.000mA ~ 20.0A) 1 loop |
| Low Current Generator | (000.0PA ~ 999.9uA) 1 loop |
| Test loop | Manage with Item Name Maker manages Max × 500 Items User manages Max × 500 Items |
| Relay action time | You can switch between 3 ms and 5ms. The default value is 3 ms. |
| Test File capacity | Test Items: Maximum 200 Number of classified items: maximum 200 |
Download Test Tables (Precision and Range)
